Yield-Infestation relationship of aphids infesting wheat and their economic injury levels Poddar Namita, Chander Subhash* Division of Entomology, ICAR-Indian Agricultural Research Institute, New Delhi, 110012 *Corresponding author Email: schanderthakur@gmail.com
Online published on 30 April, 2019. Abstract The effect of aphid complex on wheat yield was studied through field experiments during rabi 2016–17 and 2017–18. Yield-infestation relationship was investigated on two widely cultivated wheat varieties HD-3059 and HD-3086 utilizing five regression models viz., linear, semi-loge (X), semi-loge (Y), loge-linear and quadratic. Optimum number of sprays to get higher yield was computed to be two sprays between 60 to 80 DAS for both the varieties. Further, economic injury levels (EIL) were determined to be 6.3 aphids/tiller at 60 and 14.4 at 70 DAS for HD-3059 and 34.6 at 60 and 29.3 aphids/tiller at 70 DAS for HD-3086. These EILs will facilitate timely management practices against the pest. Top Keywords Wheat, aphid, EIL, threshold level, number of sprays, regression models, yield, infestation, relationship. Top |